This book examines surface analysis techniques from a paper industry point of view; it places heavy emphasis on applications of various methods of characterization and analysis. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner.

Surface Analysis of Paper provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper. Several chapters discuss analytical techniques useful for pulp and paper characterization which have not previously been adequately explored in the literature.

From the Preface: “Paper owes much of its versatility to its surface characteristics, as these can be tailored to a variety of applications. Characterizing and controlling these properties is central to product development and control, and the outgrowth of new analytical techniques in chemistry and microscopy provides us with a rich array of sophisticated tools. Our intent in compiling this book is to provide the collective experience of people who use many of these tools in the paper industry...”

Target Audience: Technical workers in the paper industry, including biologists, chemical engineers, and chemists; materials scientists; and reference libraries in academic or industrial settings.

Table of Contents:

Physical Characterization of Surfaces:

Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy

Scanning Electron Microscopy: A Tool for the Analysis of Wood Pulp Fibers and Paper

Mechanical and Physical Properties of Paper Surfaces

The Surface Chemistry of Paper: Its Relationship to Printability and Other Paper Technologies

Brightness Properties of Pulp and Paper

Spectroscopic Methods:

FT-IR Spectroscopy

Near-Red Infrared Spectroscopy of Wood Products

Raman Spectroscopy

Energy Dispersive X-Ray Spectroscopic Analysis

SIMS: Secondary Ion Mass Spectrometry

X-Ray Photoelectron Spectroscopy

Emerging Technologies:

Principles of Electron Energy Loss Spectroscopy and Its Application to the Analysis of Paper

Surface Analysis Using Millimeter-Wave Resonant Instruments

Atomic Force Microscopy

Using the Photon Tunneling Microscope to View Paper Surfaces

Index