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The second edition of this popular textbook provides a clear, well-written introduction to the
principal techniques used in surface analysis, together with the computational methods used to interpret
the increasingly complex data these techniques generate. Coverage includes the basic theory and
practice of each technique, together with practical examples of its use. Most chapters include review
questions, enabling readers to develop and test their understanding. New material includes entirely new
chapters on dynamic SIMS and multivariate data analysis, as well as extensive revision of chapters included
in the original edition.
From the Preface: “...Most surface problems, be they in basic surface science or applied
surface analysis, require careful selection of the most appropriate technique to answer the questions
posed. Frequently more than one technique will be required. It is anticipated that readers of this book will
be equipped to make the judgements required. Thus the book should be of value to those who need to
have a wide overview of the techniques in education or in industrial quality control or R & D
laboratories. For those who wish to further develop their knowledge and practice of particular techniques,
it should also give a good basic understanding from which to build.”
Target Audience: Industrial analytical scientists, technologists, and materials analysts; and
upper-level students in materials and surface science.
Table of Contents:
Introduction
Auger Electron Spectroscopy
Electron Spectroscopy for Chemical Analysis
Molecular Surface Mass Spectrometry by SIMS
Dynamic SIMS
Low-Energy Ion Scattering and Rutherford Backscattering
Vibrational Spectroscopy from Surfaces
Surface Structure Determination by Interference Techniques
Scanning Probe Microscopy
The Application of Multivariate Data Analysis Techniques in Surface Analysis
Appendix 1: Vacuum Technology for Applied Surface Science
Appendix 2: Units, Fundamental Physical Constants and Conversions
Index
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