In today's world there are vast areas of materials technology which stand to benefit from the application of surface analysis techniques in both research and quality control. Surface Analysis: The Principal Techniques introduces the theory and practice of the principal techniques which have shown themselves to be effective in both basic research and in applied surface analysis.

The book brings the reader to a level of knowledge at which it is possible to understand data generated by each technique and see how it relates to the type of problems they wish to tackle. The coverage is thorough without being too detailed. Examples of analysis are provided in each case, and review questions at the close of most chapters help the reader to reinforce what has been learned.

From the Preface: “...Most surface problems, be they in basic surface science or applied surface analysis, require careful selection of the most appropriate technique to answer the questions posed. Frequently more than one technique will be required. It is anticipated that the reader of this book will be equipped to make the judgements required. Thus the book should be of value to those who need to have a wide overview of the techniques in education or in industrial quality control or R & D laboratories. For those who wish to further develop their knowledge and practice of particular techniques, it should also give a good basic understanding from which to build.”

Target Audience: Industrial analytical scientists, techologists, and materials analysts; and upper-level undergraduate and graduate students in materials and surface science.

Table of Contents:

Introduction

Vacuum Testing for Applied Surface Science

Electron Spectroscopy for Chemical Analysis

Auger Electron Spectroscopy

Secondary Ion Mass Spectrometry — the Surface Mass Spectrometry

Low-energy Ion Scattering and Rutherford Backscattering

Vibrational Spectroscopy from Surfaces

Surface Structure Determination by Interference Techniques

Scanning Tunnelling Microscopy and Atomic Force Microscopy

Index