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Title: Surface Analysis: The Principle Techniques, 2nd Ed.
Surface Analysis: The Principle Techniques, 2nd Ed.
By: John C. Vickerman and Ian S. Gilmore, eds.
ISBN: 978 0470 01764 7
Publisher: John Wiley & Sons
Copyright: 2009
Page Count: 686
Trim Size: 6.6 x 9.6
Format: Paperback
Catalog #: 03128
Status: Normally in stock
List Price: $70.00
Our Price: $66.50
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Keywords associated with this title: Spectroscopy and Spectrometry
Surface Analysis


The second edition of this popular textbook provides a clear, well-written introduction to the principal techniques used in surface analysis, together with the computational methods used to interpret the increasingly complex data these techniques generate. Coverage includes the basic theory and practice of each technique, together with practical examples of its use. Most chapters include review questions, enabling readers to develop and test their understanding. New material includes entirely new chapters on dynamic SIMS and multivariate data analysis, as well as extensive revision of chapters included in the original edition.

From the Preface: “...Most surface problems, be they in basic surface science or applied surface analysis, require careful selection of the most appropriate technique to answer the questions posed. Frequently more than one technique will be required. It is anticipated that readers of this book will be equipped to make the judgements required. Thus the book should be of value to those who need to have a wide overview of the techniques in education or in industrial quality control or R & D laboratories. For those who wish to further develop their knowledge and practice of particular techniques, it should also give a good basic understanding from which to build.”

Target Audience: Industrial analytical scientists, technologists, and materials analysts; and upper-level students in materials and surface science.

Table of Contents:


Auger Electron Spectroscopy

Electron Spectroscopy for Chemical Analysis

Molecular Surface Mass Spectrometry by SIMS

Dynamic SIMS

Low-Energy Ion Scattering and Rutherford Backscattering

Vibrational Spectroscopy from Surfaces

Surface Structure Determination by Interference Techniques

Scanning Probe Microscopy

The Application of Multivariate Data Analysis Techniques in Surface Analysis

Appendix 1: Vacuum Technology for Applied Surface Science

Appendix 2: Units, Fundamental Physical Constants and Conversions



Primary Topic: Surface Characterization and Analysis
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