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This hands-on resource integrates the latest advances in instrumentation and methods
(including electron optical and scanned probe microscopy, high speed resolution imaging, and
synchrotron-based techniques), offering a top-down approach to solving problems in surface and interface analysis.
It emphasizes problem solving for different classes of materials and material functions, showing how
the most rational and efficient route to a problem's solution can be determined.
Handbook of Surface and Interface Analysis: Methods for
Problem-Solving discusses x-ray photoelectron,
auger electron, and ion scattering spectroscopy; surface mass spectrometry and depth profiling; ion
beam effects and ion implantation; surface specific methods for problem-solving in tribology;
catalyst characterization; analysis techniques in metallurgy, microelectronics and semiconductors,
minerals, ceramics, glasses, and composites; and more.
From the Preface: “...[W]hat might be called the `traditional' surface analytical techniques are
now fully mature and capable of being applied as routine tools of the trade in a remarkably wide range
of technological problems. Unlike most earlier volumes, therefore, the present book reflects that
maturity in that the emphasis is not, as before, on the techniques but on the problems that they are required
to help solve...”
Target Audience: Physical, surface, colloid, and analytical chemists; materials scientists; surface
and interface technologists; solid-state physicists; ceramic, polymer, and metallurgical engineers;
and graduate-level students in these fields.
Brief Table of Contents:
Introduction
Elements of Problem-Solving
How to Use This Book
Spectroscopic Techniques: X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and
Ion Scattering Spectroscopy
Compositional Analysis by Auger Electron and X-Ray Photoelectron Spectroscopy
Ion Beam Techniques: Surface Mass Spectrometry
In-Depth Analysis: Methods for Depth Profiling
Ion Beam Effects in Thin Surface Films and Interfaces
Surface Modification by Ion Implantation
Introduction to Scanned Probe Microscopy
Metallurgy
Microelectronics and Semiconductors
Minerals, Ceramics, and Glasses
Composites
Corrosion and Surface Analysis: An Integrated Approach Involving Spectroscopic and
Electrochemical Methods
Problem-Solving Methods in Tribology with Surface-Specific Techniques
Catalyst Characterization
Adhesion Science and Technology
Archaeomaterials
Appendix 1: Physical Constants and Conversion Factors
Appendix 2: Data for the Elements and Isotopes
Appendix 3: Less Commonly Used Techniques for Analysis of Surfaces and Interfaces
Appendix 4: Core-Level Binding Energies, Auger Kinetic Energies, and Modified Auger
Parameters for Some Chemical Elements in Various Compounds
Appendix 5: Documentary Standards in Surface Analysis: The Way of the Future?
Index
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