This book provides an in-depth treatment of the instrumentation, physical bases, and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.

Surface Analysis of Polymers by XPS and Static SIMS illuminates the techniques of XPS and SSIMS, with explanations of what types of information can be derived from each method. It includes case studies which demonstrate the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to material properties.

From the Preface: “...The behaviour of polymer surfaces is important in many technologies and understanding this behaviour requires surface charaterisation with a high degree of chemical specificity, in terms of composition and structure, for species covering a wide range of molecular weight. The application of X-ray photoelectron spectroscopy (XPS or ESCA) and, later, static secondary ion mass spectroscopy (SSIMS), in the early stages of the development of the techniques, to polymer surface analysis surely count as major successes. The requirements for polymer surface analysis have continued to be important drivers in the evolution of instrumental capabilities, because of the importance of this materials sector...”

Target Audience: Academic and industrial researchers interested in polymer surfaces and surface analysis.

Table of Contents:

Introduction

XPS

Information from Polymer XPS

Statics SIMS (SSIMS)

Information from SSIMS

Polymer Surface Analysis Case Studies

References

Index