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Title: Handbook of IR Spectroscopy of Ultrathin Films
Handbook of IR Spectroscopy of Ultrathin Films
By: Valeri P. Tolstoy, Irina Chernyshova, and Valeri A. Skryshevsky
ISBN: 978 0471 35404 8
Publisher: Wiley - Interscience
Copyright: 2003
Page Count: 736
Trim Size: 6.1 x 9.2
Format: Hardcover
Catalog #: 03603
Status: Normally in stock
List Price: $365.00
Our Price: $305.00
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Keywords associated with this title: Spectroscopy and Spectrometry
Test Methods
Thin Films

 

Advances in spectrometer design and computer processing technology have made it possible to use IR spectrometry to characterize very thin films at extended interfaces. The Handbook of Infrared Spectroscopy of Ultrathin Films provides a practical guide to experimental methods (including optimum conditions for recording spectra and their interpretation), equipment and techniques, up-to-date theory, and considerable reference data. It contains the information needed to apply IR spectroscopy to the analysis and evaluation of thin and ultrathin films on flat and rough surfaces and on powders at solid—gaseous, solid—liquid, liquid—gaseous, liquid—liquid, and solid—solid interfaces.

From the Preface: “In this book, we will designate ultrathin films, or, as they are also called in the literature, nanolayers, to mean layers ranging from submonolayers to several monolayers; these may be formed from a wide range of organic and inorganic substances or present adsorbed atoms, molecules, biological species, on a substrate or at the interface of two media. These films play an important role in many current areas of research in science and technology, such as submicroelectronics, optoelectronics, optics, bioscience, flotation, materials science of catalysts, sorbents, pigments, protective and passivating coatings, and sensors...”

Target Audience: Spectroscopists and other researchers and technologists studying ultrathin films at surfaces and interfaces, as well as upper-level students of optics, spectroscopy, semiconductor technology, and related disciplines.

Table of Contents:

Introduction

Absorption and Reflection of Infrared Radiation by Ultrathin Films

Optimum Conditions for Recording Infrared Spectra of Ultrathin Films

Interpretation of IR Spectra of Ultrathin Films

Equipment and Techniques

Infrared Spectroscopy of Thin Layers in Silicon Microelectronics

Application of Infrared Spectroscopy to Analysis of Interfaces and Thin Dielectric Layers in Semiconductor Technology

Ultrathin Films at Gas—Solid, Gas—Liquid, and Solid—Liquid Interfaces

Appendix

Index

 

Primary Topic: Surface Characterization and Analysis
Related Topics: Interfacial Engineering and Surface Science
Materials Science
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