Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces — including battery applications. Seamlessly merging theoretical fundamentals with cutting-edge practical applications, Principles and Applications of Ion Scattering Spectrometry represents the first and only book focused exclusively on this field. The bibliography is extensive.

From the Preface: “Ion scattering and recoiling spectrometry has developed over the last 30 years into an important surface elemental and structural analysis technique. This is mainly due to its high sensitivity, its ability to detect all elements, and its capability of surface structure analysis. Such information is vital to understanding the physical and chemical properties and the reactivity of surfaces...The book has been prepared with the aim of serving both a pedagogical need and a research need...”

Target Audience: Engineers, researchers, professors, upper-level students, and postdoctoral associates involved in surface analysis, surface science, and studies of surface materials.

Table of Contents:

Introduction

Theoretical Description of Atomic Collisions

Experimental Methods

General Features of Ion Scattering and Recoiling Spectra

Structural Analysis from Time-of-Flight Scattering and Recoiling Spectrometry

Real-Space Surface Crystallography from Scattering and Recoiling Imaging Spectrometry

Applications of TOF-SARS and SARIS to Surface Structure Analysis

Ion—Surface Charge Exchange and Inelastic Energy Losses

Hyperthermal Reactive Ion Scattering for Molecular Analysis on Surfaces

Bibliography of Ion Scattering Publications

Index