The development and quality of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics of equipment and applications to offer a comparison of these methods. This allows the reader to find the optimum solution to any given problem. The chapters on electron, ion, and photon detection comprise the bulk of the book.

From the Preface: “...Such surface changes can be made by ion implantation, deposition of thin films or epitaxially grown layers, among others. In all these cases, it is necessary to analyze the surface, the layer or system of layers, the grain boundaries, or other interfaces in order to control the process which finally meets the technological requirements for a purposefully changed surface. A wealth of analytical methods is available to the analyst...”

Target Audience: Researchers, analysts, technologists, scientists, and upper-level students who are concerned with surface and thin film analysis.

Brief Table of Contents:

Introduction

Electron Detection

Ion Detection

Photon Detection

Scanning Probe Microscopy

Summary and Comparison of Techniques

Surface and Thin Film Analytical Equipment Suppliers

References

Index