Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. The second edition of this popular work provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies.

This revised edition has been updated and expanded to reflect important advances and new applications. In addition to the numerous examples, the second edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology.

From the Preface: “...With the commercialization of many new imaging modes and the application to new fields, the needs of the average user of scanning probe microscopy (SPM) have changed. For example imaging modes based on magnetic forces and on surface potential are now routine, rather than specialty tools. The extended use of intermittent contact modes in and out of liquids has greatly expanded applications in life sciences. The purpose of this second edition is to address this broader field with the expectation that readers will again be positioned to use current tools and to exploit the advances of the next decade...”

Target Audience: Surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences, as well as advanced students in these disciplines.

Table of Contents:

Fundamentals of Operation:

Introduction

Basic Principles of Scanning Probe Microscopy

Theory of Scanning Tunneling Microscopy

Methods of Tunneling Spectroscopy with the STM

Tips and Surfaces:

The Surface Structure of Crystalline Solids

The Preparation of Tip and Sample Surfaces for Scanning Probe Experiments

Applications of Scanning Probe Microscopy:

Electrostatic and Magnetic Force Microscopy

BEEM and the Characterization of Buried Interfaces

The Scanning Probe Microscope in Biology

Nanomechanics

Near-Field Scanning Optical Microscopy

Applications in Electrochemistry

Appendices: Definitions, Empirical Simulation of STM Images, Calculations of Tunneling Current

Index