This book offers a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with the underlying concepts, An Introduction to Surface Analysis by XPS and AES moves on to explain underlying physical principles, discusses the instrumentation employed, and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering, and complementary methods is also included.

From the Preface: “...In XPS, X-ray monochromators are now becoming the norm and imaging has become commonplace. In AES, field emission sources are to be seen on high-performance systems. Against that backdrop it was clear that a new, broader introductory book was required which explored the basic principles and applications of the techniques, along with the emerging innovations in instrument design. We hope that this book has achieved that aim...Further information on all the topics can be found in the Bibliography and the titles of papers and so on have been included along with the more usual citations to guide such reading...”

Target Audience: An invaluable text for upper level students; also a useful reference for newcomers to surface science needing familiarization with these techniques.

Table of Contents:

Electron Spectroscopy: Some Basic Concepts

Electron Spectrometer Design

The Electron Spectrum: Qualitative and Quantitative Interpretation

Compositional Depth Profiling

Applications of Electron Spectroscopy in Materials Science

Comparison of XPS and AES with Other Analytical Techniques

Glossary

Bibliography

Appendices

Index