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This book discusses experimental studies and advanced computer simulations to document
diffusion processes and various other properties operative in advanced technological materials. It centers on
the interplay among the atomic arrangements, defects, and driving forces commonly encountered in
solids used in bulk or thin films in determining diffusion and, ultimately, the reliability of materials used
in advanced technologies.
From the Preface: “...This book is about the games atoms play in diffusion and various other
properties of materials. While diffusion has been studied for more than 100 years in solids, its
importance, excitement, and intellectual challenges remain undiminished with time. It is central to
understanding the relationship between the structure and properties of naturally occurring and synthetic
materials, which is at the root of current technological development and innovations. The diversity of
material has led to spectacular progress in functional inorganics, polymers, granular materials,
photonics, complex oxides, metallic glasses, quasi-crystals, and strongly correlated electronic materials.
The integrity of complex materials packages is determined by diffusion, a highly interactive and
synergic phenomenon that interrelates to the microstructure, the microchemistry, and the superimposed
physical fields...”
Target Audience: Engineers, chemists, materials scientists, and physicists in industry and
academia who are involved with nanotechnology, surface science, and semiconductors.
Table of Contents:
Diffusion in Bulk Solids and Thin Films: Some Phenomenological Examples
Solid State Diffusion and Bulk Properties
Atomistic Computer Simulation of Diffusion
Bulk and Grain Boundary Diffusion in Intermetallic Compounds
Diffusion Barriers in Semiconductor Devices/Circuits
Reactive Phase Formation: Some Theory and Applications
Metal Diffusion in Polymers and on Polymer Surfaces
Measurement of Stresses in Thin Films and Their Relaxation
Electromigration in Cu Thin Films
Diffusion in Some Perovskites: HTSC Cuprates and a Piezoelectric Ceramic
Index
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